The VectorStar ME7838 Series delivers the industry’s broadest frequency sweep range in a single 2-port measurement—making it ideal for engineers involved in next-gen device modeling, mmWave circuit design, or sub-THz on-wafer characterization. Anritsu’s NLTL technology enables superior raw directivity and stability, meaning less frequent calibrations and greater productivity.
With variants covering 110 GHz, 125 GHz, 145 GHz, and up to 220 GHz, the ME7838 Series supports extensive applications from passive component testing to advanced semiconductor verification. The ME7838G model, paired with MPI's TITAN T220 probe, is optimized for on-wafer testing up to 220 GHz, eliminating the instability of traditional threaded connectors.
Additional options such as the Spectrum Analyzer (Option 49) enable measurements like harmonics and spectral occupancy within the same test environment. The Cold Source Noise Figure and Differential Noise Figure options expand testing capabilities, making the ME7838 the only VNA platform capable of performing precision NF measurements across such a wide bandwidth.
Whether used in R&D, characterization labs, or production environments, the ME7838 Series offers an unmatched balance of performance, flexibility, and confidence.
